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US Patent Issued to NuFlare Technology on Oct. 27 for "Blanking aperture array mechanism and writing apparatus" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,467, issued on Oct. 27, was assigned to NuFlare Technology Inc. (Yokohama, Japan). "Blanking aperture array mechanism and writing apparatus... और पढ़ें


US Patent Issued to EBARA on Oct. 27 for "Insulating structure, electrostatic lens, and charged particle beam device" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,468, issued on Oct. 27, was assigned to EBARA Corp. (Tokyo). "Insulating structure, electrostatic lens, and charged particle beam device" w... और पढ़ें


US Patent Issued to Carl Zeiss Microscopy on Oct. 27 for "Operating a particle beam apparatus" (German Inventor)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,469, issued on Oct. 27, was assigned to Carl Zeiss Microscopy GmbH (Jena, Germany). "Operating a particle beam apparatus" was invented by S... और पढ़ें


US Patent Issued to ASML Netherlands on Oct. 27 for "Method of generating a sample map, computer program product, charged particle inspection system, method of processing a sample, assessment method" (California Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,470, issued on Oct. 27, was assigned to ASML Netherlands B.V. (Veldhoven, Netherlands). "Method of generating a sample map, computer progra... और पढ़ें


US Patent Issued to APPLIED MATERALS on Oct. 27 for "Electrically conductive ceramic electric field blocking plate" (California Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,471, issued on Oct. 27, was assigned to APPLIED MATERALS INC.. "Electrically conductive ceramic electric field blocking plate" was invented... और पढ़ें


US Patent Issued to Hitachi High-Tech on Oct. 27 for "Charged particle beam inspection system and charged particle beam inspection method" (Japanese Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,472, issued on Oct. 27, was assigned to Hitachi High-Tech Corp. (Tokyo). "Charged particle beam inspection system and charged particle beam... और पढ़ें


US Patent Issued to ASML Netherlands on Oct. 27 for "Readout circuit for pixelized electron detector" (Dutch Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,473, issued on Oct. 27, was assigned to ASML Netherlands B.V. (Veldhoven, Netherlands). "Readout circuit for pixelized electron detector" w... और पढ़ें


US Patent Issued to FEI on Oct. 27 for "Scanning patterns for scientific instruments" (Dutch Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,474, issued on Oct. 27, was assigned to FEI COMPANY (Hillsboro, Ore.). "Scanning patterns for scientific instruments" was invented by Gert-... और पढ़ें


US Patent Issued to Oxford Instruments Nanotechnology Tools on Oct. 27 for "Navigation for electron microscopy" (British Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,475, issued on Oct. 27, was assigned to Oxford Instruments Nanotechnology Tools Ltd. (High Wycombe, Great Britain). "Navigation for electro... और पढ़ें


US Patent Issued to EHT Ventures on Oct. 27 for "Pulsing power supply with powered crowbar" (Washington Inventors)

ALEXANDRIA, Va., Oct. 27 -- United States Patent no. 12,776,476, issued on Oct. 27, was assigned to EHT Ventures LLC (Seattle). "Pulsing power supply with powered crowbar" was invented by Kenneth Mil... और पढ़ें